"Custom specifications available" Non-contact film thickness gauge 'FF8'
The measurement data can be saved to a file, and re-analysis is possible later with a non-contact film thickness measurement system!
The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveform) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to create continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.
- Company：システムロード
- Price：Other
